Historical Electronics Museum, Inc. - History of the Nation's Defense Electronics
About Us Visitor Info Exhibitions Resources Educators & Students Get Involved Facility Rentals News & Events Contact
Press Room
Archives:


Test as you fly – Mission success through realistic testing

Thursday, March 18th 2010

Hadi Navid
Environmental Test Facility Supervisor
Johns Hopkins University Applied Physics Laboratory (JHU/APL)
Space Department

Test as you fly – Mission success through realistic testing
Space science and exploration missions are becoming increasingly more complex and expensive. In order to assure mission success, it is critical to develop test scenarios that more closely simulate the actual operational environment of the spacecraft. Even though environmental testing is a highly labor
intensive and costly endeavor, the consequences of inadequate testing could be performance anomalies
and in some cases complete mission failure.

Wednesday, April 7, 2010 7pm - 8:30pm
Admission at the door $10/$5 NEM & IEEE Members
Information: 410-765-0230

 

The National Electronics Museum is organized into twelve related exhibit galleries:
 
1. Fundamentals Gallery
2. Communications Gallery
3. Early Radar Gallery
4. Cold War Radar Gallery
5. Modern Radar Gallery
6. Countermeasures Gallery
7. Under Seas Gallery
8. Electro-optical Gallery
9. Space Sensor Gallery
10. Past Gallery
11. Web Gallery
12. WWII Radar Kiosk

 
Click here for an Adobe pdf showing the gallery layout

Use the links below to quickly access popular content areas:  
 
 

About Us  |  Visitor info  |  Exhibitions  |  Resources  |  Educators & Students  |  Get Involved  |  Facility Rentals
News & Events  |  Contact  |  Privacy Policy  |  Home

National Electronics Museum, Inc.   1745 West Nursery Road   Linthicum, Maryland  |  Phone: 410-765-0230
Copyright © 2005-2010 National Electronics Museum, Inc.

WebConnection, A Web Design Group, maintains this Web Site. Click Here to report any performance issues.